Head of product management & applications department of NT-MDT Co.
Dr. Pavel Dorozhkin graduated with honours from Moscow Institute of Physics and Technology (State University, “Phystech”) in 1999 in the field of applied physics and mathematics. In 1999 – 2001 he worked in National Institute of Materials Science (Tsukuba, Japan). His research was focused on low energy electron microscopy, scanning probe microscopy, electron transport and field emission of carbon nanotubes, semiconductor nanowires and other nanoscale materials.
Pavel Dorozhkin received his PhD degree in 2003 in the Institute of Solid State Physics of the Russian Academy of Sciences (Chernogolovka, Russia). His experimental work was focused on optical spectroscopy of individual semimagnetic quantum dots at helium temperatures and high magnetic fields. He also did research on electrical transport and optical spectroscopy of low-dimensional electron systems. As a result of above research activity in 1999 – 2004, Pavel Dorozhkin published more than 35 papers.
Dr. Dorozhkin started at NT-MDT in 2005 as a head of R&D team designing optical equipment and methods. Currently he is a Head of product & applications development. He in charge of all commercial and technical aspects of NT-MDT product line integrating atomic force microscopy (AFM) with optics as well as some other lines of equipment. Dr. Dorozhkin and his team develop equipment, probes, methods and applications in this field. Pavel Dorozhkin is in charge of product development, worldwide marketing and sales, service and customer support.
Dr. Dorozhkin led development and successful worldwide commercialization of various NT-MDT lines of equipment integrating scanning probe microscopy and optical techniques (Raman spectroscopy, confocal microscopy, fluorescence lifetime imaging, scanning near-field optical microscopy and others). Starting from 2010, the NT-MDT worldwide sales of this equipment exceed 10 million USD per year. Most of the equipment is exported from Russia to Europe, Asia, North and South America.
In particular, unique equipment and methods for super-resolution optical microscopy with the use of AFM probe for light localization were developed at NT-MDT and commercialized. This includes aperture and apertureless scanning near-field optical microscopy, Tip Enhanced Raman Scattering and others. Spatial resolution of these optical techniques reaches 10 nm – exceeding diffraction limit of classical optical resolution by a factor of 50.